Average Current Through a Single-electron Transistor Under Fluctuations of an Observer’s Frame of Reference

Yun-Sok Shin

doi:doi:10.11648/j.ajpa.20190705.14

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Average Current Through a Single-electron Transistor Under Fluctuations of an Observer’s Frame of Reference

Yun-Sok Shin

Published in American Journal of Physics and Applications (Volume 7, Issue 5)

Received: 13 August 2019 Accepted: 28 August 2019 Published: 16 September 2019

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Abstract

The average current through a single-electron transistor (SET) under fluctuations of an observer’s frame of reference (OFR) is reported. To date, the average current through a SET has been studied under the assumption that an OFR remains constant throughout the performance of measurements of the current; thus, it remains an unsolved problem as to what is measured of the current when the OFR is assumed to fluctuate. In this paper, a SET comprising a source, drain, and single channel is considered, where an OFR is assumed to be matched to the electrochemical potential energy of the drain of the SET. The average current through the SET for two types of OFR fluctuation is formulated: periodic-square-wave fluctuation and periodic-sawtooth-wave fluctuation, in time representations. Under these types of fluctuation, the average current exhibits a zero-bias Coulomb peak—the amplitude of which gradually increases with the amplitude of the fluctuation type divided by temperature. The amplitude of the zero-bias Coulomb peak is greater in the case of periodic-square-wave fluctuations. Therefore, the amplitude of the zero-bias Coulomb peak together with a varying of both the energy of the channel and the temperature has the potential to reveal the distribution of fluctuations of an OFR.

Published in	American Journal of Physics and Applications (Volume 7, Issue 5)
DOI	10.11648/j.ajpa.20190705.14
Page(s)	118-124
Creative Commons	This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited.
Copyright	Copyright © The Author(s), 2019. Published by Science Publishing Group

Keywords

Single-electron Transistor, Quantum Dot, Coulomb Peak, Coulomb Blockade, Observer Effect, Fluctuating Frame of Reference

References

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Yun-Sok Shin. (2019). Average Current Through a Single-electron Transistor Under Fluctuations of an Observer’s Frame of Reference. American Journal of Physics and Applications, 7(5), 118-124. https://doi.org/10.11648/j.ajpa.20190705.14

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Yun-Sok Shin. Average Current Through a Single-electron Transistor Under Fluctuations of an Observer’s Frame of Reference. Am. J. Phys. Appl. 2019, 7(5), 118-124. doi: 10.11648/j.ajpa.20190705.14

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AMA Style

Yun-Sok Shin. Average Current Through a Single-electron Transistor Under Fluctuations of an Observer’s Frame of Reference. Am J Phys Appl. 2019;7(5):118-124. doi: 10.11648/j.ajpa.20190705.14

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@article{10.11648/j.ajpa.20190705.14,
  author = {Yun-Sok Shin},
  title = {Average Current Through a Single-electron Transistor Under Fluctuations of an Observer’s Frame of Reference},
  journal = {American Journal of Physics and Applications},
  volume = {7},
  number = {5},
  pages = {118-124},
  doi = {10.11648/j.ajpa.20190705.14},
  url = {https://doi.org/10.11648/j.ajpa.20190705.14},
  eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.ajpa.20190705.14},
  abstract = {The average current through a single-electron transistor (SET) under fluctuations of an observer’s frame of reference (OFR) is reported. To date, the average current through a SET has been studied under the assumption that an OFR remains constant throughout the performance of measurements of the current; thus, it remains an unsolved problem as to what is measured of the current when the OFR is assumed to fluctuate. In this paper, a SET comprising a source, drain, and single channel is considered, where an OFR is assumed to be matched to the electrochemical potential energy of the drain of the SET. The average current through the SET for two types of OFR fluctuation is formulated: periodic-square-wave fluctuation and periodic-sawtooth-wave fluctuation, in time representations. Under these types of fluctuation, the average current exhibits a zero-bias Coulomb peak—the amplitude of which gradually increases with the amplitude of the fluctuation type divided by temperature. The amplitude of the zero-bias Coulomb peak is greater in the case of periodic-square-wave fluctuations. Therefore, the amplitude of the zero-bias Coulomb peak together with a varying of both the energy of the channel and the temperature has the potential to reveal the distribution of fluctuations of an OFR.},
 year = {2019}
}

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TY  - JOUR
T1  - Average Current Through a Single-electron Transistor Under Fluctuations of an Observer’s Frame of Reference
AU  - Yun-Sok Shin
Y1  - 2019/09/16
PY  - 2019
N1  - https://doi.org/10.11648/j.ajpa.20190705.14
DO  - 10.11648/j.ajpa.20190705.14
T2  - American Journal of Physics and Applications
JF  - American Journal of Physics and Applications
JO  - American Journal of Physics and Applications
SP  - 118
EP  - 124
PB  - Science Publishing Group
SN  - 2330-4308
UR  - https://doi.org/10.11648/j.ajpa.20190705.14
AB  - The average current through a single-electron transistor (SET) under fluctuations of an observer’s frame of reference (OFR) is reported. To date, the average current through a SET has been studied under the assumption that an OFR remains constant throughout the performance of measurements of the current; thus, it remains an unsolved problem as to what is measured of the current when the OFR is assumed to fluctuate. In this paper, a SET comprising a source, drain, and single channel is considered, where an OFR is assumed to be matched to the electrochemical potential energy of the drain of the SET. The average current through the SET for two types of OFR fluctuation is formulated: periodic-square-wave fluctuation and periodic-sawtooth-wave fluctuation, in time representations. Under these types of fluctuation, the average current exhibits a zero-bias Coulomb peak—the amplitude of which gradually increases with the amplitude of the fluctuation type divided by temperature. The amplitude of the zero-bias Coulomb peak is greater in the case of periodic-square-wave fluctuations. Therefore, the amplitude of the zero-bias Coulomb peak together with a varying of both the energy of the channel and the temperature has the potential to reveal the distribution of fluctuations of an OFR.
VL  - 7
IS  - 5
ER  -

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Yun-Sok Shin

Sejong Academy of Science and Arts, Sejong, Republic of Korea

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Yun-Sok Shin. (2019). Average Current Through a Single-electron Transistor Under Fluctuations of an Observer’s Frame of Reference. American Journal of Physics and Applications, 7(5), 118-124. https://doi.org/10.11648/j.ajpa.20190705.14

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ACS Style

Yun-Sok Shin. Average Current Through a Single-electron Transistor Under Fluctuations of an Observer’s Frame of Reference. Am. J. Phys. Appl. 2019, 7(5), 118-124. doi: 10.11648/j.ajpa.20190705.14

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AMA Style

Yun-Sok Shin. Average Current Through a Single-electron Transistor Under Fluctuations of an Observer’s Frame of Reference. Am J Phys Appl. 2019;7(5):118-124. doi: 10.11648/j.ajpa.20190705.14

Copy | Download

@article{10.11648/j.ajpa.20190705.14,
  author = {Yun-Sok Shin},
  title = {Average Current Through a Single-electron Transistor Under Fluctuations of an Observer’s Frame of Reference},
  journal = {American Journal of Physics and Applications},
  volume = {7},
  number = {5},
  pages = {118-124},
  doi = {10.11648/j.ajpa.20190705.14},
  url = {https://doi.org/10.11648/j.ajpa.20190705.14},
  eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.ajpa.20190705.14},
  abstract = {The average current through a single-electron transistor (SET) under fluctuations of an observer’s frame of reference (OFR) is reported. To date, the average current through a SET has been studied under the assumption that an OFR remains constant throughout the performance of measurements of the current; thus, it remains an unsolved problem as to what is measured of the current when the OFR is assumed to fluctuate. In this paper, a SET comprising a source, drain, and single channel is considered, where an OFR is assumed to be matched to the electrochemical potential energy of the drain of the SET. The average current through the SET for two types of OFR fluctuation is formulated: periodic-square-wave fluctuation and periodic-sawtooth-wave fluctuation, in time representations. Under these types of fluctuation, the average current exhibits a zero-bias Coulomb peak—the amplitude of which gradually increases with the amplitude of the fluctuation type divided by temperature. The amplitude of the zero-bias Coulomb peak is greater in the case of periodic-square-wave fluctuations. Therefore, the amplitude of the zero-bias Coulomb peak together with a varying of both the energy of the channel and the temperature has the potential to reveal the distribution of fluctuations of an OFR.},
 year = {2019}
}

Copy | Download

TY  - JOUR
T1  - Average Current Through a Single-electron Transistor Under Fluctuations of an Observer’s Frame of Reference
AU  - Yun-Sok Shin
Y1  - 2019/09/16
PY  - 2019
N1  - https://doi.org/10.11648/j.ajpa.20190705.14
DO  - 10.11648/j.ajpa.20190705.14
T2  - American Journal of Physics and Applications
JF  - American Journal of Physics and Applications
JO  - American Journal of Physics and Applications
SP  - 118
EP  - 124
PB  - Science Publishing Group
SN  - 2330-4308
UR  - https://doi.org/10.11648/j.ajpa.20190705.14
AB  - The average current through a single-electron transistor (SET) under fluctuations of an observer’s frame of reference (OFR) is reported. To date, the average current through a SET has been studied under the assumption that an OFR remains constant throughout the performance of measurements of the current; thus, it remains an unsolved problem as to what is measured of the current when the OFR is assumed to fluctuate. In this paper, a SET comprising a source, drain, and single channel is considered, where an OFR is assumed to be matched to the electrochemical potential energy of the drain of the SET. The average current through the SET for two types of OFR fluctuation is formulated: periodic-square-wave fluctuation and periodic-sawtooth-wave fluctuation, in time representations. Under these types of fluctuation, the average current exhibits a zero-bias Coulomb peak—the amplitude of which gradually increases with the amplitude of the fluctuation type divided by temperature. The amplitude of the zero-bias Coulomb peak is greater in the case of periodic-square-wave fluctuations. Therefore, the amplitude of the zero-bias Coulomb peak together with a varying of both the energy of the channel and the temperature has the potential to reveal the distribution of fluctuations of an OFR.
VL  - 7
IS  - 5
ER  -

Copy | Download