To better understand some of the local metallurgical mechanisms, it is necessary to have information about the scale of the stress gradient in the vicinity of a grain boundary or around a precipitate. This measurement is accessible by Kossel microdiffraction. Diffraction consists of the emission of Kossel cones, which are then intercepted by a screen. This leads to an image that can be used to trace the deformation field. The simulation technique is best suited to this purpose. The present work falls within this framework and aims on the one hand to geometrically model the phenomenon and on the other hand to develop an application in Java language for digital simulations of the Kossel cliché. The methodology adopted is to take into account all the parameters on which the phenomenon depends to establish the geometric model which has been programmed in the JAVA language with a view to making a simulation application comprising 14 interacting classes. The result obtained after an example of simulation is rather satisfactory and promising. However, a comparison will have to be made for the complete validation of the model. This will be the subject of another publication later.
Published in | American Journal of Physical Chemistry (Volume 10, Issue 4) |
DOI | 10.11648/j.ajpc.20211004.18 |
Page(s) | 104-111 |
Creative Commons |
This is an Open Access article, distributed under the terms of the Creative Commons Attribution 4.0 International License (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted use, distribution and reproduction in any medium or format, provided the original work is properly cited. |
Copyright |
Copyright © The Author(s), 2021. Published by Science Publishing Group |
Kossel Micro Diffraction, Cone, Observation Screen, Deformation Field, Image
[1] | Lonsdale, K. (1947). The divergent X-ray photography of crystals. Philosophical Transactions of the Royal Society A. Vol. 240, 219-258. |
[2] | Hanneman, R. E., Ogilvie, R. E., Modrzejewski, A. (1962). Kossel line studies of irradiated nickel crystals. Journal of Applied Physics. Vol. 33. |
[3] | Frazer, J., Arrhenius, G. (1966). Divergent-beam diffraction geometry for interpretation of Kossel diffraction patterns in space group assignment lattice parameters and structure factor evaluation. X-ray Optics and Microanalysis. Edition Hermann. |
[4] | Morris, W. G. (1968). Crystal orientation and lattice parameters from Kossel lines. Journal of Applied Physics. Vol. 39. |
[5] | Tixier, R., Waché, C. (1970). Kossel patterns. Journal of Applied Crystallography. Vol. 3, 466-485. |
[6] | Langer, E., Kurt, R., Däbritz, S. (1999). KOPSKO: a computer program for generation of Kossel and pseudo-Kossel diffraction patterns. Crystal Research and Technology. Vol. 34, 801-816. |
[7] | Weber, S., Schetelich, Ch., Geist, V. (1994). Computer-aided evaluation of Kossel patterns obtained from quasicrystals. Crystal Research and Technology. Vol. 29, 727-735. |
[8] | Pesci, R., Inal, K., Berveiller, S., Patoor, E., Lecomte, J. S., Eberhardt, A. (2006). Inter and intra granular stress determination with Kossel microdiffraction in a scanning electron microscope. Materials Science Forum. Vol. 524-525, 109-114. |
[9] | Denis BOUSCAUD, Thèse: Développement de la microdiffraction Kossel pour l’analyse des déformations et contraintes à l’échelle du micromètre - Applications à des matériaux cristallins (Thesis: Development of Kossel microdiffraction for the analysis of deformations and stresses at the micrometer scale - Applications to crystalline materials), 2012. |
[10] | J._M André, P. Jonnard, K. Le Guen, F. Bridou, Kossel diffraction and photonic modes in one-dimensional photonic cristal, PACS numbers 78.67. Pt, 78-70. En, 42.70 Qs, 61-05 C, 2015. |
[11] | Meiyi Wu, Karine Le Guen, Jean-Michel André, Philippe Jonnard, Ian Vickridge, et al.. Kossel diffraction observed with X-ray color camera during PIXE of nano-scale periodic multilayer. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, Elsevier, 2019, 450, pp. 252-256. |
[12] | D. Bouscaud, S. Berveiller, R. Pesci, C. Rivero, K. Inal, C. Maurice, R. Fortunier, K. Dzieciol, R. Vayrette, Hétérogénéités de contraintes intragranulaires: Détermination par approche couplée EBSD-Kossel (Heterogeneities of intragranular constraints: Determination by coupled EBSD-Kossel approach), 20ème Congrès Français de Mécanique, Besançon, 29 août au 2 septembre 2011. |
[13] | Faigel, G, G. Bortel, M. Tegze, Experimental phase determination of the structure factor from Kossel, line profile. Sci. Rep. 6, 22904; doi: 10.1038/srep22904, 2016. |
[14] | André ANGOT, Compléments de Mathématiques à l’usage des ingénieurs de l’électrotechnique et des télécommunications (Mathematics Complements for the Use of Electrical and Telecommunications Engineers), Paris, 1957. |
[15] | Henri Garreta, Fascicule de cours: Langage Java (Course booklet: Java language), 2004. |
[16] | Ivor Horton, Beginning Java 2-JDK 1.3, Edition, Wrox Press, 2001. |
APA Style
Fannou Jean-Louis Comlan, Semassou Guy Clarence, Moussa Djibril Aliou, Gerbaud Patrice, Hougan Aristide. (2021). Implementation and Realization of a Kossel Diffraction Pattern Simulation Application. American Journal of Physical Chemistry, 10(4), 104-111. https://doi.org/10.11648/j.ajpc.20211004.18
ACS Style
Fannou Jean-Louis Comlan; Semassou Guy Clarence; Moussa Djibril Aliou; Gerbaud Patrice; Hougan Aristide. Implementation and Realization of a Kossel Diffraction Pattern Simulation Application. Am. J. Phys. Chem. 2021, 10(4), 104-111. doi: 10.11648/j.ajpc.20211004.18
AMA Style
Fannou Jean-Louis Comlan, Semassou Guy Clarence, Moussa Djibril Aliou, Gerbaud Patrice, Hougan Aristide. Implementation and Realization of a Kossel Diffraction Pattern Simulation Application. Am J Phys Chem. 2021;10(4):104-111. doi: 10.11648/j.ajpc.20211004.18
@article{10.11648/j.ajpc.20211004.18, author = {Fannou Jean-Louis Comlan and Semassou Guy Clarence and Moussa Djibril Aliou and Gerbaud Patrice and Hougan Aristide}, title = {Implementation and Realization of a Kossel Diffraction Pattern Simulation Application}, journal = {American Journal of Physical Chemistry}, volume = {10}, number = {4}, pages = {104-111}, doi = {10.11648/j.ajpc.20211004.18}, url = {https://doi.org/10.11648/j.ajpc.20211004.18}, eprint = {https://article.sciencepublishinggroup.com/pdf/10.11648.j.ajpc.20211004.18}, abstract = {To better understand some of the local metallurgical mechanisms, it is necessary to have information about the scale of the stress gradient in the vicinity of a grain boundary or around a precipitate. This measurement is accessible by Kossel microdiffraction. Diffraction consists of the emission of Kossel cones, which are then intercepted by a screen. This leads to an image that can be used to trace the deformation field. The simulation technique is best suited to this purpose. The present work falls within this framework and aims on the one hand to geometrically model the phenomenon and on the other hand to develop an application in Java language for digital simulations of the Kossel cliché. The methodology adopted is to take into account all the parameters on which the phenomenon depends to establish the geometric model which has been programmed in the JAVA language with a view to making a simulation application comprising 14 interacting classes. The result obtained after an example of simulation is rather satisfactory and promising. However, a comparison will have to be made for the complete validation of the model. This will be the subject of another publication later.}, year = {2021} }
TY - JOUR T1 - Implementation and Realization of a Kossel Diffraction Pattern Simulation Application AU - Fannou Jean-Louis Comlan AU - Semassou Guy Clarence AU - Moussa Djibril Aliou AU - Gerbaud Patrice AU - Hougan Aristide Y1 - 2021/11/29 PY - 2021 N1 - https://doi.org/10.11648/j.ajpc.20211004.18 DO - 10.11648/j.ajpc.20211004.18 T2 - American Journal of Physical Chemistry JF - American Journal of Physical Chemistry JO - American Journal of Physical Chemistry SP - 104 EP - 111 PB - Science Publishing Group SN - 2327-2449 UR - https://doi.org/10.11648/j.ajpc.20211004.18 AB - To better understand some of the local metallurgical mechanisms, it is necessary to have information about the scale of the stress gradient in the vicinity of a grain boundary or around a precipitate. This measurement is accessible by Kossel microdiffraction. Diffraction consists of the emission of Kossel cones, which are then intercepted by a screen. This leads to an image that can be used to trace the deformation field. The simulation technique is best suited to this purpose. The present work falls within this framework and aims on the one hand to geometrically model the phenomenon and on the other hand to develop an application in Java language for digital simulations of the Kossel cliché. The methodology adopted is to take into account all the parameters on which the phenomenon depends to establish the geometric model which has been programmed in the JAVA language with a view to making a simulation application comprising 14 interacting classes. The result obtained after an example of simulation is rather satisfactory and promising. However, a comparison will have to be made for the complete validation of the model. This will be the subject of another publication later. VL - 10 IS - 4 ER -